روش جدید رقیق سازی دوگانه برای تحلیل کمی فازها با پراش پرتو ایکس بدون ترسیم منحنیهای همسنجی
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Abstract:
The new method of double dil ution can be used to a nalyse quantitatively all the phases of a multiphase system wit hout the need to construct calibration curves, and with as few as 2 or 3 mixtures prepa red for X-ray diffraction. A specific weight of the powdered specimen which is to be analysed, is mixed with a fixed proportion of internal standard. The standard can be any crysta ll ine compou nd with a prefe rably symmetrical StruclUre, not present in the original specimen. The other part to be mixed is a combi nation of finely ground pure phases or materials of known purity. Area under the diffracted peaks or integra ted inte nsi ty h measured. At least twO X-ray samples of known and different proportions shou ld be employed. Intcnsily ratiO, Y axis, is plotted against weight ratio, X axis, so that a linea r plol for combina tion of 2 peaks from each phase and standard is plaited. Required phase is read from the in tercept of the abscfssu. Mathematics of lilt:: m4!thod Is ctlscussc<1 with a n example of determining alumina, mullite. q uartz a nd silicon in a ceramic test piece containing glassy phase
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تحلیل کمی مواد با پراش سنجی پرتو x مقایهس روش آشنای استاندارد داخلی با روش جدید نسبت شیب ها
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X-ray diffraction (XRD) technique is commonly used for qualilative ana lysis of minerals, and has also been successfully used for quantitative measurements. In this research, the matrix fl ushing and a new X-ray diffraction method have been used for the determination of crystallinity and amorphous content of Opal and Quartz mixture. The PCAPD is used to detemline the quanti tative analysi...
full textپیشرفتهای اخیر در شناسایی پلیمرها با استفاده از پراش پرتو ایکس
پس از مقدمهای بر ساختار و شکلشناسی پلیمرها، پارامترهای ساختاری که معمولا با استفاده از فنون پراش پرتو ایکس اندازه گیری میشوند، مرور میشود. قابلیتهای نوین اندازه گیری و ارتباط آنها با درک مبانی ساختاری عملکرد بحث خواهد شد. برای نشان دادن پیشرفتهای اخیر پراش پرتو ایکس در پلیمرها، دو فن ریزپراش و پراکندگی افزایش یافته سطحی، دو زمینه مطالعه سینتیک تبلور و تغییر شکل پلیمر و دومثال از تجزیه و ت...
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Journal title
volume 3 issue 1
pages 79- 87
publication date 1995-04
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